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We present a comprehensive overview over infrared imaging techniques for (electrical) silicon solar cell characterization. Recent method development in local series resistance imaging is reviewed in more detail and new results in local breakdown investigations on multicrystalline (mc) silicon solar cells are reported. We observe local junction breakdown sites on industrial mc-cells at reverse voltages...
In order to identify the components responsible for the creation of the metastable defect in boron-doped Cz-Si, the impact of different impurities on the defect concentration has been examined carefully on a wide range of different Cz-materials by means of lifetime measurements. In good agreement with previous studies a linear dependence on the boron concentration has been found. The impact of carbon...
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