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When using Elliptic Curve Cryptography (ECC) in constrained embedded devices such as RFID tags, López-Dahab's method along with the Montgomery powering ladder is considered as the most suitable method. It uses x-coordinate only for point representation, and meanwhile offers intrinsic protection against simple power analysis. This paper proposes a low-cost fault detection mechanism for Elliptic Curve...
The testability of cryptographic cores brings an extra dimension to the process of digital circuits testing security. The benefits of the classical methods such as the scan-chain method introduce new vulnerabilities concerning the data protection. The Built-In Self-Test (BIST) is considered to be the most suitable countermeasure for this purpose. In this work we propose the use of a digit-serial multiplier...
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