Search results for: Yuan Lu
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351