Wyniki wyszukiwania dla: Feng-Tso Chien
Solid-State Electronics > 2017 > 137 > C > 10-15
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2975 - 2979
IEEE Electron Device Letters > 2016 > 37 > 7 > 886 - 889
Microelectronics Reliability > 2016 > 59 > C > 44-48
Materials Science in Semiconductor Processing > 2015 > 30 > Complete > 41-47
Microelectronics Reliability > 2014 > 54 > 6-7 > 1282-1287
Microelectronic Engineering > 2014 > 114 > Complete > 117-120
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2113 - 2118
Microelectronics Reliability > 2013 > 53 > 12 > 1897-1900
Microelectronics Reliability > 2013 > 53 > 8 > 1130-1136
Microelectronics Reliability > 2013 > 53 > 3 > 405-408
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3877 - 3882
IEEE Transactions on Electron Devices > 2013 > 60 > 2 > 799 - 804
Microelectronics Reliability > 2012 > 52 > 11 > 2551-2555
Microelectronics Reliability > 2012 > 52 > 6 > 969-973