Search results for: N. Michael Oldham
IEEE Transactions on Instrumentation and Measurement > 1983 > 32 > 1 > 176 - 179
IEEE Transactions on Instrumentation and Measurement > 1978 > 27 > 4 > 460 - 464
IEEE Transactions on Instrumentation and Measurement > 1983 > 32 > 1 > 176 - 179
IEEE Transactions on Instrumentation and Measurement > 1978 > 27 > 4 > 460 - 464