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Scattering scanning near field microscopy is capable of measuring the response of a material to incident infrared light with a resolution determined by the tip radius of the antenna. We present new methods and results here, in which broad band and ultrafast sources are used to extend this technique into the time and frequency domains.
Tapered slot antennas (TSAs) consist of a planar non-resonant structure which couples incident radiation to a propagating waveguide mode. They are commonly used at microwave and radio frequencies because they are fundamentally broadband and have small profiles. Because of their planar layout and broadband response they have recently been scaled to infrared frequencies where they have advantages for...
Combining scattering-scanning near-field optical microscopy (s-SNOM) with infrared synchrotron micro-spectroscopy we determine the magnetic near-field modes of an infrared linear antenna by measuring the electric field of its electro-magnetic dual, the linear slot antenna.
We measure the electrical permittivity of different bulk and film gold samples by spectroscopic ellipsometry from 200 nm to 20 μm, resolving inconsistencies on plasmon resonances, lifetime, and SPP propagation associated with imprecise current literature values.
We reconstruct the magnetic near-field and source current distribution of a linear coupled-dipole IR optical antenna from the complete 3D electric vector near-field as probed using scattering-type scanning near-field optical microscopy. Fine details associated with antenna coupling are observed.
The near-field distribution of linear optical antennas is measured with phase-contrast scattering-type near-field microscopy (s-SNOM). A distinct scaling behavior with antenna length is observed for different structures with and without gap.
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