Search results for: G. Busatto
Microelectronics Reliability > 2017 > 76-77 > C > 314-320
Microelectronics Reliability > 2015 > 55 > 9-10 > 1496-1500
IEEE Transactions on Nuclear Science > 2015 > 62 > 1-2 > 202 - 209
Microelectronics Reliability > 2014 > 54 > 9-10 > 2200-2206
Microelectronics Reliability > 2014 > 54 > 9-10 > 1927-1934
Microelectronics Reliability > 2013 > 53 > 9-11 > 1707-1712
Microelectronics Reliability > 2013 > 53 > 9-11 > 1481-1485
IEEE Transactions on Nuclear Science > 2013 > 60 > 5-3 > 3793 - 3801
Microelectronics Reliability > 2012 > 52 > 9-10 > 2465-2470
Microelectronics Reliability > 2012 > 52 > 9-10 > 2420-2425
Microelectronics Reliability > 2012 > 52 > 9-10 > 2363-2367
Nuclear Inst. and Methods in Physics Research, B > 2012 > 273 > Complete > 234-236
Microelectronics Reliability > 2011 > 51 > 9-11 > 1995-1998
Microelectronics Reliability > 2010 > 50 > 9-11 > 1842-1847
Acta Psychiatrica Scandinavica > 121 > 3 > 216 - 226