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In this paper, we report the experimental results of a 3.3-kV-rated clustered insulated gate bipolar transistor (CIGBT) with planar gates in nonpunchthrough technology (NPT) and rapid thermal annealing (RTA) anode. Previously, it had been shown that, for identical turn-off losses, the on -state voltage of the 3.3-kV CIGBT is more than 0.7 V lower than that of an equivalent IGBT. Herein, we show that,...
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