Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2812 - 2819
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 242 - 249
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 493 - 498