Search results for: Ming-Dou Ker
Microelectronics Reliability > 2017 > 78 > C > 258-266
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Electron Device Letters > 2013 > 34 > 5 > 674 - 676
IEEE Journal of Solid-State Circuits > 2007 > 42 > 5 > 1158 - 1168