Search results for: Y.R. Lin
NDT & E International > 2015 > 74 > C > 81-86
Optical Materials > 2015 > 39 > C > 118-124
Measurement > 2011 > 44 > 6 > 1177-1182
Electronics Letters > 2009 > 45 > 13 > 682 - 683
Journal of Materials Processing Tech. > 2008 > 200 > 1-3 > 59-70
IEEE Transactions on Nanotechnology > 2007 > 6 > 6 > 595 - 600
Applied Physics A > 2004 > 79 > 7 > 1741-1745