Search results for: Sharad C. Seth
IEEE Transactions on Computers > 2014 > 63 > 7 > 1656 - 1667
Journal of Electronic Testing > 2003 > 19 > 3 > 271-284
IEEE Transactions on Computers > 1977 > C-26 > 1 > 29 - 33
IEEE Transactions on Computers > 2014 > 63 > 7 > 1656 - 1667
Journal of Electronic Testing > 2003 > 19 > 3 > 271-284
IEEE Transactions on Computers > 1977 > C-26 > 1 > 29 - 33