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Diabet. Med. 28, 450–454 (2011)
AbstractAim In diabetes, endothelial dysfunction and an altered retinal blood flow have been reported and precede overt macrovascular and microvascular disease. Furthermore, an association between postprandial hyperglycaemia, retinopathy and cardiovascular disease has been observed.Methods Endothelial function and retinal vascular reactivity have been measured in...
This work proposes a new, software-based, defect detection and diagnosis technique. We introduce a novel set of instructions, called access-control extensions (ACE), that can access and control the microprocessor's internal state. Special firmware periodically suspends microprocessor execution and uses the ACE instructions to run directed tests on the hardware. When a hardware defect is present, these...
Higher level of resource integration and the addition of new features in modern multi-processors put a significant pressure on their verification. Although a large amount of resources and time are devoted to the verification phase of modern processors, many design bugs escape the verification process and slip into processors operating in the field. These design bugs often lead to lower quality products,...
Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures, gate-oxide wearout, and transient faults are becoming increasingly common. In order to overcome these issues and develop robust design techniques for large-market silicon ICs, it is necessary to rely on accurate failure analysis...
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future processor systems, unless new online techniques become available to detect and to tolerate them while preserving the integrity of software applications running on the system. This paper proposes a new, software-based, defect...
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life-time, due to early transistor failures, gate oxide wear-out, manufacturing defects, and radiation-induced soft errors (SER). In this paper we present a low-cost technique to harden a microprocessor pipeline and caches against...
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