Search results for: R. Ghandi
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-2.1 - 2A-2.8
IEEE Electron Device Letters > 2011 > 32 > 5 > 596 - 598
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 259 - 265
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2081 - 2087
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 704 - 711
IEEE Electron Device Letters > 2008 > 29 > 10 > 1135 - 1137