Search results for: A. Bennecer
Case Studies in Nondestructive Testing and Evaluation > 2016 > 6 > PA > 89-93
Electronics Letters > 2008 > 44 > 9 > 593 - 594
IEEE Photonics Technology Letters > 2008 > 20 > 16 > 1411 - 1413
Case Studies in Nondestructive Testing and Evaluation > 2016 > 6 > PA > 89-93
Electronics Letters > 2008 > 44 > 9 > 593 - 594
IEEE Photonics Technology Letters > 2008 > 20 > 16 > 1411 - 1413