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Pulsed laser testing is a useful technique for an accurate inspection of potential weak zones in a layout of an integrated circuit. A laser pulse can provoke a similar effect as a particle hitting with the advantage of a perfect location of the hitting point. The present work describes a general method to determine a Pulsed Laser Single Event Upset (SEU) Cross Section over digital circuits by means...
This work presents the determination of a Pulsed Laser SEU Cross-Section (Count Statistics). In this work, a coincidence detector has been used to count fault events by comparing the digital VLSI circuit under test with a replica of the design running on a control FPGA. A SEU is declared when a specific fault pattern is detected. The target chip design generates specific fault patterns under pulsed...
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