Search results for: Hsing-Huang Tseng
Microelectronic Engineering > 2013 > 112 > Complete > 80-83
Microelectronic Engineering > 2011 > 88 > 12 > 3411-3414
Solid State Electronics > 2011 > 65-66 > Complete > 22-27
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2917 - 2923
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106
IEEE Transactions on Nanotechnology > 2010 > 9 > 2 > 258 - 263
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 626 - 631
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2047 - 2056
Microelectronic Engineering > 2009 > 86 > 7-9 > 1722-1727
Microelectronics Reliability > 2009 > 49 > 2 > 103-112
IEEE Electron Device Letters > 2009 > 30 > 11 > 1140 - 1142
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Electron Device Letters > 2009 > 30 > 3 > 285 - 287
IEEE Electron Device Letters > 2009 > 30 > 7 > 760 - 762
Materials Science & Engineering B > 2008 > 154-155 > Complete > 102-105