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This paper deals with the deep characterization of a novel electrical parasitic effect in AlGaN/GaN technology so called “electrical runaway mechanism.” It is characterized by an anomalous gate current behaviour. Electrical measurements versus temperature show that the runaway mechanism threshold is temperature independent on the contrary to the gate current progression as a function of ${\mathrm {V}}_{\mathrm{DS}}$ ...
This study reports on a reliability investigation of AlGaN/GaN HEMTs submitted to life tests in High Temperature Operating (HTO) conditions at 150°C, 175°C, 275°C and 320°C. These life tests showed two different degradation steps of the drain current. One is occurring in the first tens of hour of the life test and characterized by a decrease of the drain current. The evolution of the electrical characteristics...
This work is a study of the degradation of AlGaN/GaN HEMTs generated by different ageing tests. The methodology is based on cross-characterisation analyses. The life tests (HTO 175°C, HTO 250°C, HTO 275°C and HTO 320°C) have mainly caused a strong decrease of the drain current at the very beginning of the test, then its partial recovery and finally its collapse. No evident degradation of the Schottky...
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