Search results for: Sunghoon Chun
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 12 > 2051 - 2055
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2009 > 28 > 9 > 1401 - 1413
Journal of Electronic Testing > 2008 > 24 > 6 > 591-595
Journal of Electronic Testing > 2007 > 23 > 4 > 357-362
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 6 > 649 - 654
Journal of Electronic Testing > 2006 > 22 > 1 > 37-48