Search results for: L. Valet
Expert Systems With Applications > 2012 > 39 > 4 > 4250-4257
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 4 > 755 - 762
Expert Systems With Applications > 2012 > 39 > 4 > 4250-4257
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 4 > 755 - 762