Search results for: R.A. Reed
Surface Science > 2015 > 635 > C > 49-54
Microelectronic Engineering > 2011 > 88 > 7 > 1259-1264
2009 IEEE Radiation Effects Data Workshop > 123 - 126
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3402 - 3407
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3071 - 3077
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3393 - 3401
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3250 - 3255
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3158 - 3164
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3085 - 3092
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3172 - 3179
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3130 - 3137
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3203 - 3209
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3078 - 3084
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3098 - 3108
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3192 - 3195
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2008 - 2013
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2225 - 2229
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2167 - 2170