Search results for: Farouk Smith
Microprocessors and Microsystems > 2013 > 37 > 3 > 313-318
Microelectronics Reliability > 2012 > 52 > 6 > 1233-1240
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-3 > 1343 - 1349
Microprocessors and Microsystems > 2013 > 37 > 3 > 313-318
Microelectronics Reliability > 2012 > 52 > 6 > 1233-1240
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-3 > 1343 - 1349