Search results for: Z. Liu
2016 IEEE International Electron Devices Meeting (IEDM) > 17.1.1 - 17.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1056 - 1060