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Industry is facing very high quality requirements for today's and tomorrow's ICs. Especially in the automotive market these quality requirements need to be fulfilled. To achieve this we need to improve currently used test methods and fault models to improve the overall defect coverage. This paper presents two new methodologies to significantly improve this situation. One method will focus on cell-internal...
Industry is facing increasingly tougher quality requirements for more complex ICs. To meet these quality requirements we need to improve the defect coverage. This paper presents a new methodology to significantly increase the defect coverage of the test patterns generated by ATPG tools. The fault model used during the ATPG is enhanced to directly target layout-based intra-cell faults. In contrast...
Despite the recent advances in ATPG technology computing test patterns for state-of-the-art industrial designs can demand an enormous amount of computation time. Numerous structural techniques were presented to reduce the search space and hence the runtime of state-of-the-art ATPG tools. Absolute dominators introduced by Kirkland and Mercer proved to be useful for finding mandatory observation nodes...
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