Search results for: O. Ginez
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 870 - 876
Journal of Electronic Testing > 2009 > 25 > 2-3 > 127-144
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 870 - 876
Journal of Electronic Testing > 2009 > 25 > 2-3 > 127-144