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The authors present a case study that employs production test data from an RF device to assess the effectiveness of four different methods in predicting the pass/fail labels of fabricated devices based on a subset of performances and, thereby, in decreasing test cost. The device employed is a zero-IF down-converter for cell-phone applications and the four methods range from a sample maximum-cover...
Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integrated circuits. While the test error probability of these methods is rather low, it is still considered prohibitive for accurate production testing. In this paper, we demonstrate how to minimize this test error probability and, thus,...
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