Search results for: Th. Nirschl
IEEE Electron Device Letters > 2007 > 28 > 4 > 315
Solid State Electronics > 2006 > 50 > 1 > 44-51
Solid State Electronics > 2004 > 48 > 12 > 2281-2286
Microelectronics Reliability > 2000 > 40 > 8-10 > 1635-1640