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In this paper, the meaning and appropriateness of complementary metal-oxide-semiconductor image sensor (CIS) modulation transfer function (MTF) is reconsidered. Two-dimensional (2-D) submicrometer spot scanning results are presented for industrial CIS, 2-D-MTF, characterizing CIS performance and resolution abilities is extracted and compared with the ideal one-dimensional (1-D) MTF profile estimation...
In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS sub arrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the...
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