Search results for: M. Buzzo
Microelectronic Engineering > 2007 > 84 > 3 > 413-418
Microelectronics Reliability > 2006 > 46 > 9-11 > 1536-1541
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 203 - 212
Microelectronics Reliability > 2005 > 45 > 9-11 > 1499-1504