Search results for: Jyi-Tsong Lin
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4937 - 4945
Microelectronics Reliability > 2017 > 74 > C > 22-26
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1561 - 1567
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 59 - 63
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 441 - 444
IEEE Electron Device Letters > 2016 > 37 > 9 > 1127 - 1130
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 903 - 909
Journal of Display Technology > 2015 > 11 > 2 > 152 - 156
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 61 - 68
Solid-State Electronics > 2014 > 92 > C > 57-62
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3172 - 3178
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1872 - 1877
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3377 - 3381
IEEE Electron Device Letters > 2012 > 33 > 6 > 830 - 832
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1381 - 1387
Solid State Electronics > 2008 > 52 > 5 > 808-812
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1480 - 1486
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2417 - 2422
IEEE Electron Device Letters > 2008 > 29 > 11 > 1222 - 1225