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Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure...
Scan technology carries the potential of being misused as a ??side channel?? to leak out the secret information of crypto cores. To address such a design challenge, this paper proposes a design-for-secure-test (DFST) solution for crypto cores by adding a stimuli-launched flip-flop into the traditional scan flip-flop to maintain the high test quality without compromising the security.
This paper presents a new unknown response masking technique to minimize the effect on test loss due to overmasking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on...
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