Search results for: L.L. Liou
Microelectronics Reliability > 1999 > 39 > 3 > 383-389
1993 IEEE MTT-S International Microwave Symposium Digest > 281 - 284 vol.1
Electronics Letters > 1991 > 27 > 6 > 523 - 524
Electronics Letters > 1990 > 26 > 18 > 1501 - 1503
Electronics Letters > 1989 > 25 > 20 > 1396 - 1398