Search results for: B. K. Jones
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 1 - 8
Microelectronics Reliability > 1997 > 37 > 10-11 > 1635-1638
Microelectronics Reliability > 1996 > 36 > 7-8 > 1051-1062
Solid State Electronics > 1996 > 39 > 2 > 287-295
Solid State Electronics > 1995 > 38 > 7 > 1413-1421