Search results for: A. Durier
Microelectronics Reliability > 2017 > 76-77 > C > 674-679
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2242 - 2249
Microelectronics Reliability > 2015 > 55 > 9-10 > 2097-2102
Microelectronics Reliability > 2017 > 76-77 > C > 674-679
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2242 - 2249
Microelectronics Reliability > 2015 > 55 > 9-10 > 2097-2102