Search results for: A. Ortiz-Conde
Solid State Electronics > 2011 > 63 > 1 > 22-26
Solid State Electronics > 2010 > 54 > 6 > 635-641
Journal of Immunological Methods > 2010 > 356 > 1-2 > 39-46
Microelectronics Reliability > 2006 > 46 > 5-6 > 731-742
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 190 - 196
Solid State Electronics > 2003 > 47 > 11 > 2067-2074
Solid State Electronics > 2003 > 47 > 1 > 93-97
Solid State Electronics > 2002 > 46 > 12 > 2295-2300
Solid State Electronics > 2002 > 46 > 6 > 853-857
Microelectronics Reliability > 2002 > 42 > 4-5 > 583-596
Microelectronics Reliability > 2002 > 42 > 3 > 343-347
Solid State Electronics > 2002 > 46 > 1 > 103-108
Solid State Electronics > 2001 > 45 > 7 > 1077-1080
Solid State Electronics > 2001 > 45 > 2 > 223-228