Search results for: Y. Yang
Microelectronics Reliability > 2016 > 61 > C > 35-42
IEEE Electron Device Letters > 2015 > 36 > 1 > 71 - 73
Journal of Solid State Electrochemistry > 2010 > 14 > 2 > 191-196
IET Micro & Nano Letters > 2008 > 3 > 2 > 35 - 40
IET Micro & Nano Letters > 2007 > 2 > 4 > 85 - 89
Materials Chemistry and Physics > 2003 > 82 > 2 > 440-443