Search results for: Vl. Kolkovsky
Microelectronics Reliability > 2017 > 76-77 > C > 145-148
physica status solidi c > 13 > 10‐12 > 786 - 789
Solid-State Electronics > 2016 > 123 > C > 89-95
Physica B: Condensed Matter > 2014 > 439 > C > 24-28
Microelectronics Reliability > 2013 > 53 > 9-11 > 1342-1345
Physica B: Physics of Condensed Matter > 2012 > 407 > 10 > 1497-1500
Energy Procedia > 2011 > 3 > Complete > 70-75
Physica B: Condensed Matter > 2009 > 404 > 23-24 > 5080-5084
Materials Science in Semiconductor Processing > 2008 > 11 > 5-6 > 354-359
Materials Science in Semiconductor Processing > 2008 > 11 > 5-6 > 336-339
Journal of Materials Science: Materials in Electronics > 2008 > 19 > 1 > 115-121
Nuclear Inst. and Methods in Physics Research, B > 2006 > 253 > 1-2 > 154-161