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This paper proposes a unified delay test architecture, in which the design resources for on-line delay fault detection can be reused to support off-line delay testing. A stability checker, which has low hardware overhead, is presented to monitor the stability violation from each critical combinational output. A global error generator, which is shared among stability checkers, can produce a global...
Faster than at-speed testing provides an effective way to detect small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing using path delay fault (PDF) model and single path sensitization...
We present nGFSIM, a GPU-based fault simulator for stuck-at faults which can report the fault coverage of one-to n-detection for any specified integer n using only a single run of fault simulation. nGFSIM, which explores the massive parallelism in the GPU architecture and optimizes the memory access and usage, enables accelerated fault simulation without the need of fault dropping. We show that nGFSIM...
With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively characterizing the vulnerability of microprocessor structures to intermittent faults at early design stage is significantly helpful to balance system performance and reliability. Prior researches have proposed several metrics to characterize...
Scan is a widely used Design-for-Testability technique to improve test and diagnosis quality. Many defects may cause scan chains to fail. In this paper, an observation point oriented Deterministic Diagnostic Pattern Generation (DDPG) method was proposed for compound defects, which tolerates the system defects during scan chain diagnosis. Instead of sensitizing multiple paths proposed in our prior...
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