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This paper presents a decoupling capacitance boosting method for on-chip resonant supply noise reduction for DVS systems. The switching controls of decoupling capacitors depending on the supply noise states achieve an effective noise reduction and fast settling time simultaneously compared with the conventional passive decoupling capacitors. The measurement results of a test chip fabricated in a 0...
The unstable/unpredictable LSI operation caused by the PVT (Process Voltage Parameter) variations, along with the aging effect such as NBTI/PBTI, is one of the serious issues in current and future scaled LSIs. In these situations, where operation environments in the field are hard to predict at the stages of circuit design and test, the conventional approach of the margin-based design and test in...
Increasing level of process variation in the sub-100 nm silicon technology is becoming an important issue. In this paper we describe an approach to estimate the impact of process variations on the static CMOS and the dual-rail PLA down to 32 nm process. This approach is built on accurate variation modeling, published data including the ITRS, Predictive Technology Models, and Monte-Carlo analysis....
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