Search results for: Ming Pan
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1635 - 1641
2016 Lester Eastman Conference (LEC) > 27 - 30
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Electron Device Letters > 2014 > 35 > 5 > 527 - 529