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We carried out Monte Carlo (MC) simulation of InAlAs/InGaAs high electron mobility transistors (HEMTs) with buried gate. We employed a T-shaped structure as a gate electrode. The maximum transconductance gm_max and gate capacitance Cg increase with increasing the buried depth d. The extent of increase in the gm_max is more than that in Cg. As a result, the cutoff frequency fT increases with increase...
We calculated the unstrained and the strained band structures of InAs and carried out Monte Carlo simulation of InGaAs/strained-InAs/InGaAs composite channel high electron mobility transistors (HEMTs) considering 2-dimensional electron gas (2DEG) self-consistent analysis by solving Schrödinger and Poisson equations. With considering the effect of 2DEG, the drain-source current Ids decreases. However,...
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