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This paper reports the experimental investigation of the impact of vacuum chamber conditions (cleanliness level and vacuum pressure) of scanning electron microscopy (SEM) on the contact resistance of two-point in-situ nanoprobing. Using two typical types of conductive nanoprobe, two-point electrical nanoprobing is performed on silicon nanowires, during which changing trends of the nanoprobing contact...
Seamless integration of functional nanomaterials on paper can boost the functionality of paper-based flexible electronics. In this article, we report the successful growth of zinc oxide nanowires (ZnO NWs) on paper substrate through a low-cost hydrothermal process. We experimentally confirm the necessity of ammonium hydroxide as assistant chemical in the growth solution. We quantify the growth rate...
This paper presents a MEMS device for simultaneous mechanical and electrical characterization of individual nanowires. The device consists of an electrostatic actuator and two capacitive sensors, enabling it to acquire all mechanical measurement data (force and displacement) electronically without relying on electron microscopy imaging. Electrical insulation within the suspended structures of the...
This paper presents a microelectromechanical systems (MEMS) device for simultaneous electrical and mechanical characterization of individual nanowires. The device consists of an electrostatic actuator and two capacitive sensors, capable of acquiring all measurement data (force and displacement) electronically without relying on electron microscopy imaging. This capability avoids the effect of electron...
This paper presents a MEMS (microelectromechanical systems) device for tensile testing of individual one-dimensional nanomaterials. Consisting of capacitive force and displacement sensors and an electrostatic actuator, the device conducts tensile testing and electronically measures nanomaterial deformations and forces. Electronic measurement permits a higher data sampling rate than electron microscopy...
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