Search results for: Jin Der Lee
Microelectronics Reliability > 2017 > 72 > C > 103-114
Applied Thermal Engineering > 2017 > 114 > C > 1275-1286
Annals of Nuclear Energy > 2016 > 94 > C > 814-825
Nuclear Engineering and Design > 2016 > 301 > C > 264-278
Annals of Nuclear Energy > 2015 > 80 > C > 77-94
Annals of Nuclear Energy > 2014 > 71 > Complete > 174-189
Annals of Nuclear Energy > 2009 > 36 > 6 > 793-801
Nuclear Engineering and Design > 2005 > 235 > 22 > 2358-2374
Annals of Nuclear Energy > 2005 > 32 > 3 > 299-329
Nuclear Engineering and Design > 2005 > 235 > 5 > 613-626