Search results for: U. Scheuermann
Microelectronics Reliability > 2017 > 76-77 > C > 480-484
Microelectronics Reliability > 2013 > 53 > 9-11 > 1687-1691
European Journal of Surgical Oncology > 2013 > 39 > 6 > 593-600
Microelectronics Reliability > 2010 > 50 > 9-11 > 1203-1209
Microelectronics Reliability > 2009 > 49 > 9-11 > 1319-1325
Microelectronics Reliability > 2007 > 47 > 9-11 > 1761-1766