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With the increasing number of clock domain crossings in modern VLSI circuits, the area, power and performance overheads introduced by synchronization have a rising impact on the overall system parameters. To minimize these overheads while still reaching the targeted system reliability, it is very important to precisely know the parameters of the circuit elements used for synchronization regarding...
In view of the numerous clock domain crossings found in modern systems-on-chip and multicore architectures precise metastability characterization is a fundamental task. We propose a conceptually novel approach for the experimental assessment of upset rate over resolution time that is usually employed to extract the relevant characteristics. Our method is based on connecting a time-to-digital converter...
The experimental metastability characterizationof a flip flop requires a controllable delay with low jitter andhigh time resolution. In FPGAs such an experiment can bevery useful for in-situ or even online characterization of agiven flip flop, but existing solutions rely on the availability ofa digital clock manager (DCM) or a phase locked loop (PLL) for implementing this controllable delay. Given...
In digital CMOS essentially all sequential function blocks may get metastable in one way or another, when provided with marginal inputs. Most often the result is a delayed reaction at the output, which, in a synchronous design, potentially violates the timing assumptions. Therefore metastable behavior is often characterized by the Mean Time Between Upset (MTBU), which reflects the expected interval...
As modern ASICs comprise an increasing number of independently clocked subsystems that need to interact, the accurate reliability assessment of synchronizers becomes crucial. Traditionally the reliability of a synchronizer is characterized by the mean time between upsets (MTBU), and the relevant flip-flop parameters are specified in a way to support MTBU calculation. In this paper we claim that actually...
We1 present an approach for experimental metasta-bility characterization of Muller C-elements. It is based on the late transition detection scheme known from flip flop characterization. Substantial additional challenges arise from the facts that with the Muller C-element the input transition to use as a reference for the output delay may change from case to case, and the error flags of the detector...
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