Search results for: Shunfeng Cheng
Microelectronics Reliability > 2017 > 75 > C > 77-95
Expert Systems With Applications > 2012 > 39 > 9 > 8467-8473
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 420 - 427
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 49 - 57
Journal of Electronic Materials > 2012 > 41 > 9 > 2419-2430
IEEE Sensors Journal > 2010 > 10 > 4 > 856 - 862
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 374 - 380
Journal of Ocean University of China > 2007 > 6 > 4 > 378-382
Journal of Virological Methods > 2006 > 135 > 2 > 173-180
NDT and E International > 2005 > 38 > 6 > 448-452