Search results for: V. S. S. Yadavalli
Quality and Reliability Engineering International > 37 > 2 > 648 - 663
Annals of Operations Research > 2015 > 233 > 1 > 517-534
2011 IEEE Congress of Evolutionary Computation (CEC) > 2337 - 2344
Microelectronics Reliability > 1995 > 35 > 12 > 1495-1499
Microelectronics Reliability > 1995 > 35 > 5 > 789-796
Microelectronics Reliability > 1995 > 35 > 4 > 699-701