Search results for: E. Simoen
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Characterization and Simulation of SOI Devices Operating under Harsh Environment > 255-260
NATO Science Series II: Mathematics, Physics and Chemistry > Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices > Noise in Nanoscale Devices > 129-136
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Radiation Effects > 221-226
NATO Science Series II: Mathematics, Physics and Chemistry > Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices > Noise in Nanoscale Devices > 121-128
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 267-286
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 287-306