Search results for: Yan Liu
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3781 - 3785
IEEE Communications Letters > 2016 > 20 > 12 > 2346 - 2349
IEEE Transactions on Reliability > 2016 > 65 > 2 > 662 - 673
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3781 - 3785
IEEE Communications Letters > 2016 > 20 > 12 > 2346 - 2349
IEEE Transactions on Reliability > 2016 > 65 > 2 > 662 - 673