Search results for: F.L. Kastensmidt
Microelectronics Reliability > 2017 > 76-77 > C > 640-643
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1950 - 1957
IEEE Transactions on Computers > 2008 > 57 > 9 > 1202 - 1215
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 2060 - 2068
IEEE Micro > 2006 > 26 > 5 > 10 - 18